000			01513cam a22003737a 4500
999			_c3500 _d3500
001			17097412
003			OSt
005			20250224164613.0
008			111227s2011 enka b 001 0 eng d
010			_a 2011293502
020			_a9780857292735
020			_a0857292730
035			_a(OCoLC)ocn747112761
040			_aIXA _beng _cKyUL _dYDXCP _dBWX _dCDX _dOUP _dDLC
041			_aEN
042			_alccopycat
050	0	0	_aQA 274 _b.N35 2011
082	0	0	_aQA 274 .N35 2011 _223
100	1		_aNakagawa, Toshio.
245	1	0	_aStochastic processes : _bwith applications to reliability theory / _cToshio Nakagawa.
260			_aLondon ; _aNew York : _bSpringer, _c2011.
300			_aix, 251 p. : _bill. ; _c24 cm.
490	1		_aSpringer series in reliability engineering, _x1614-7839
504			_aIncludes bibliographical references and index.
650		0	_aStochastic processes.
650		0	_aReliability (Engineering) _2Statistics _xSchool of Pure and Applied Sciences
830		0	_aSpringer series in reliability engineering. _x1614-7839
856	4	2	_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy1205/2011293502-b.html
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy1205/2011293502-d.html
856	4	1	_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy1205/2011293502-t.html
906			_a7 _bcbc _ccopycat _d2 _encip _f20 _gy-gencatlg
942			_2lcc _cLLB