| 000 | 00594nam a22001817a 4500 | ||
|---|---|---|---|
| 999 |
_c1845 _d1845 |
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| 005 | 20260528111249.0 | ||
| 008 | 150814b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a81-7808-769-3 | ||
| 040 |
_aKYUCL _cKYUCL |
||
| 041 | _aEN | ||
| 050 |
_aTK 7895 _b.C44 2002 |
||
| 082 | _aTK 7895 .C43 2002 | ||
| 245 |
_afault-torelance and reliability techniques for high-density random-access memories _cby Chakraborty, Kanad and Pinaki Mazumder |
||
| 260 |
_aNew Delhi, _bPearson, _c2002. |
||
| 300 | _a426p.: | ||
| 650 |
_2Electrical Engineering _xSchool of Engineering and Technology |
||
| 942 |
_2lcc _cLLB |
||